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KENNEDY 25-50mm External Micrometer

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R1,051.61
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KEN3350020K
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New
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Description

Enamelled Frame And Tungsten Carbide Tipped Anvils. Manufactured To Bs 870. Supplied In A Durable Plastic Case. Flatness: 0.6mm. Parallelism: (2 + L/100) µm (Fraction Rounded Down). Instrumental Error: ±(1 + L/75) µm (Fraction Rounded Up). L = Maximum Measuring Length
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