Micrometers

Made of cast iron, it is designed for use with most standard micrometers up to 100mm (4"). The clamp has positive angular and padded parallel clamping jaws. 90° pivoting in the vertical plane. • Additional Features Padded clamping...

Enamelled Frame And Tungsten Carbide Tipped Anvils. Manufactured To Bs 870. Supplied In A Durable Plastic Case. Flatness: 0.6mm. Parallelism: (2 + L/100) µm (Fraction Rounded Down). Instrumental Error: ±(1 + L/75) µm (Fraction Rounded Up). L =...

Enamelled Frame And Tungsten Carbide Tipped Anvils. Manufactured To Bs 870. Supplied In A Durable Plastic Case. Flatness: 0.6mm. Parallelism: (2 + L/100) µm (Fraction Rounded Down). Instrumental Error: ±(1 + L/75) µm (Fraction Rounded Up). L =...

Replacement styli for Kennedy lever type dial test indicators. Carbide Steel.301-963 - Stylus to suit old style metric types only.301-986 - Stylus to suit new style metric types only.301-986 - Stylus to suit old style imperial types only...

Enamelled Frame And Tungsten Carbide Tipped Anvils. Manufactured To Bs 870. Supplied In A Durable Plastic Case. Flatness: 0.6mm. Parallelism: (2 + L/100) µm (Fraction Rounded Down). Instrumental Error: ±(1 + L/75) µm (Fraction Rounded Up). L =...

Enamelled Frame And Tungsten Carbide Tipped Anvils. Manufactured To Bs 870. Supplied In A Durable Plastic Case. Flatness: 0.6mm. Parallelism: (2 + L/100) µm (Fraction Rounded Down). Instrumental Error: ±(1 + L/75) µm (Fraction Rounded Up). L =...

Enamelled Frame And Tungsten Carbide Tipped Anvils. Manufactured To Bs 870. Supplied In A Durable Plastic Case. Flatness: 0.6mm. Parallelism: (2 + L/100) µm (Fraction Rounded Down). Instrumental Error: ±(1 + L/75) µm (Fraction Rounded Up). L =...

Enamelled Frame And Tungsten Carbide Tipped Anvils. Manufactured To Bs 870. Supplied In A Durable Plastic Case. Flatness: 0.6mm. Parallelism: (2 + L/100) µm (Fraction Rounded Down). Instrumental Error: ±(1 + L/75) µm (Fraction Rounded Up). L =...

Manufactured To Bs 870. Supplied In A Durable Plastic Case. Flatness: 0.6mm. Parallelism: (2 + L/100) µm (Fraction Rounded Down). Instrumental Error: ±(1 + L/75) µm (Fraction Rounded Up). L = Maximum Measuring Length